发明名称 METHOD FOR DESIGNING TWO-DIMENSIONAL ARRAY OVERLAY TARGET SETS AND METHOD AND SYSTEM FOR MEASURING OVERLAY ERRORS USING THE SAME
摘要 A method for designing a two-dimensional array overlay target set comprises the steps of: selecting a plurality of two-dimensional array overlay target sets having different overlay errors; calculating a deviation of a simulated diffraction spectra for each two-dimensional array overlay target set; selecting a sensitive overlay target set by taking the deviations of the simulated diffraction spectra into consideration; and designing a two-dimensional array overlay target set based on the structural parameters of the sensitive overlay target set.
申请公布号 US2011154272(A1) 申请公布日期 2011.06.23
申请号 US20090648895 申请日期 2009.12.29
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 HSU WEI TE;KU YI SHA;PANG HSIU LAN;SHYU DEH MING
分类号 G06F17/50 主分类号 G06F17/50
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