发明名称 Method of Forming an Electrical Fuse and a Metal Gate Transistor and the Related Electrical Fuse
摘要 The present invention provides a method of integrating an electrical fuse process into a high-k/metal gate process. The method simultaneously forms a dummy gate stack of a transistor and a dummy gate stack of an e-fuse; and simultaneously removes the polysilicon of the dummy gate stack in the transistor region and the polysilicon of the dummy gate stack in the e-fuse region. Thereafter, the work function metal layer disposed in the opening of the e-fuse region is removed; and the opening in the transistor region and the opening in the e-fuse region with metal conductive structures are filled to form an e-fuse and a metal gate of a transistor.
申请公布号 US2011147853(A1) 申请公布日期 2011.06.23
申请号 US20090641322 申请日期 2009.12.18
申请人 UNITED MICROELECTRONICS CORPORATION 发明人 LIN YUNG-CHANG;WU KUEI-SHENG;WONG CHANG-CHIEN
分类号 H01L27/06;H01L21/768;H01L21/8234;H01L23/525 主分类号 H01L27/06
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