发明名称 WET OXIDATION PROCESS PERFORMED ON A DIELECTRIC MATERIAL FORMED FROM A FLOWABLE CVD PROCESS
摘要 Methods of performing a wet oxidation process on a silicon containing dielectric material filling within trenches or vias defined within a substrate are provided. In one embodiment, a method of forming a dielectric material on a substrate includes forming a dielectric material on a substrate by a flowable CVD process, curing the dielectric material disposed on the substrate, performing a wet oxidation process on the dielectric material disposed on the substrate, and forming an oxidized dielectric material on the substrate.
申请公布号 US2011151677(A1) 申请公布日期 2011.06.23
申请号 US20090643196 申请日期 2009.12.21
申请人 APPLIED MATERIALS, INC. 发明人 WANG LINLIN;MALLICK ABHIJIT BASU;INGLE NITIN K.
分类号 H01L21/316 主分类号 H01L21/316
代理机构 代理人
主权项
地址