发明名称 METAL GATE FILL AND METHOD OF MAKING
摘要 The present disclosure provides various methods of fabricating a semiconductor device. A method of fabricating a semiconductor device includes providing a semiconductor substrate and forming a gate structure over the substrate. The gate structure includes a first spacer and a second spacer formed apart from the first spacer. The gate structure also includes a dummy gate formed between the first and second spacers. The method also includes removing a portion of the dummy gate from the gate structure thereby forming a partial trench. Additionally, the method includes removing a portion of the first spacer and a portion of the second spacer adjacent the partial trench thereby forming a widened portion of the partial trench. In addition, the method includes removing a remaining portion of the dummy gate from the gate structure thereby forming a full trench. A high k film and a metal gate are formed in the full trench.
申请公布号 US2011151655(A1) 申请公布日期 2011.06.23
申请号 US20090641560 申请日期 2009.12.18
申请人 CHAN BOR-WEN;TSAU HSUEH WEN;HSU KUANG-YUAN 发明人 CHAN BOR-WEN;TSAU HSUEH WEN;HSU KUANG-YUAN
分类号 H01L21/28 主分类号 H01L21/28
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