发明名称 RADIATION-SENSITIVE RESIN COMPOSITION FOR LIQUID IMMERSION LITHOGRAPHY, POLYMER, AND RESIST PATTERN-FORMING METHOD
摘要 A radiation-sensitive resin composition for liquid immersion lithography includes a resin component, a photoacid generator and a solvent. The resin component includes an acid-dissociable group-containing resin in an amount of more than 50% by mass. The acid-dissociable group-containing resin includes a repeating unit that includes a fluorine atom and an acid-dissociable group in a side chain of the repeating unit.
申请公布号 US2011151378(A1) 申请公布日期 2011.06.23
申请号 US20100949790 申请日期 2010.11.19
申请人 JSR CORPORATION 发明人 MATSUMURA NOBUJI;SOYANO AKIMASA;ASANO YUUSUKE;NARUOKA TAKEHIKO;SAKAKIBARA HIROKAZU;SHIMIZU MAKOTO;NISHIMURA YUKIO
分类号 G03F7/004;C08F220/22;C08F220/28;G03F7/20 主分类号 G03F7/004
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