发明名称 PHOTOMASK BLANK, AND PROCESS FOR PRODUCTION OF PHOTOMASK
摘要 A photomask blank comprising: a light-shielding film (13) that contains chromium, cannot be etched substantially by a fluorine-based dry etching process, and can be etched by an oxygen-containing chlorine-based dry etching process; and a film (14) that does not contain chromium, can be etched by both a fluorine-based dry etching process and an oxygen-containing chlorine-based dry etching process, and is laminated on the light-shielding film (13).
申请公布号 WO2011074430(A1) 申请公布日期 2011.06.23
申请号 WO2010JP71720 申请日期 2010.12.03
申请人 TOPPAN PRINTING CO., LTD.;SHIN-ETSU CHEMICAL CO., LTD.;KOJIMA, YOSUKE;YOSHIKAWA, HIROKI;INAZUKI, YUKIO;KOITABASHI, RYUJI 发明人 KOJIMA, YOSUKE;YOSHIKAWA, HIROKI;INAZUKI, YUKIO;KOITABASHI, RYUJI
分类号 G03F1/32;G03F1/54;H01L21/027 主分类号 G03F1/32
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