| 摘要 |
A local skew detecting circuit for a semiconductor apparatus include a reference delay block located on the center of the semiconductor apparatus, the reference delay block being configured to receive a predetermined signal and generate a reference delay signal by delaying the predetermined signal by a delay time and a first timing detecting block located on one edge of the semiconductor apparatus, the first timing detecting block being configured to receive the predetermined signal, generate a first delay signal by delaying the predetermined signal by the delay time, and detect an enable timing order of the reference delay signal and the first delay signal to generate a first detection signal. |
