发明名称 METAL GATE STRUCTURE OF A FIELD EFFECT TRANSISTOR
摘要 The invention relates to integrated circuit fabrication, and more particularly to a Field Effect Transistor with a low resistance metal gate electrode. An exemplary structure for a gate electrode for a Field Effect Transistor comprises a lower portion formed of a first metal material having a recess and a first resistance; and an upper portion formed of a second metal material having a protrusion and a second resistance, wherein the protrusion extends into the recess, wherein the second resistance is lower than the first resistance.
申请公布号 US2011147858(A1) 申请公布日期 2011.06.23
申请号 US20090643414 申请日期 2009.12.21
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIM PENG-SOON;LEE DA-YUAN;HSU KUANG-YUAN
分类号 H01L29/49;H01L29/78 主分类号 H01L29/49
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