| 摘要 |
The present disclosure relates to a device for analyzing a dissolved particle sample, said device comprising a microscope system, said microscope system comprising support supporting said sample, an illumination source operably emitting a luminous energizing beam, an optic member focusing said luminous energizing beam into a focal point on said sample, and a spatial filter operably defining an analyzed space around the focal point, and said microscope system comprising an interface operably enhancing said luminous energizing beam, said enhancement interface including a strictly positive focal length and a refractive index greater than the refractive index of said sample, at least a portion of said enhancement interface being disposed on the path of said luminous energizing beam downstream from said support and upstream from said focal point, and at least a portion of said enhancement interface not being rigidly connected to said support. The present disclosure also relates to a method for analyzing a dissolved particle sample by such an analyzing device.
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