发明名称 MATERIALS FOR INTERFACING HIGH-K DIELECTRIC LAYERS WITH III-V SEMICONDUCTORS
摘要 A group III chalcogenide layer for interfacing a high-k dielectric to a III-V semiconductor surface and methods of forming the same. A III-V QWFET includes a gate stack which comprises a high-K gate dielectric layer disposed on an interfacial layer comprising a group III chalcogenide. In an embodiment, a III-V semiconductor surface comprising a native oxide is sequentially exposed to TMA and H2S provided in an ALD process to remove substantially all the native oxide and form an Al2S3 layer on the semiconductor surface.
申请公布号 US2011147795(A1) 申请公布日期 2011.06.23
申请号 US20090646436 申请日期 2009.12.23
申请人 RACHMADY WILLY;RADOSAVLJEVIC MARKO;DEWEY GILBERT;CHAU ROBERT S 发明人 RACHMADY WILLY;RADOSAVLJEVIC MARKO;DEWEY GILBERT;CHAU ROBERT S.
分类号 H01L29/78;H01L21/335 主分类号 H01L29/78
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