| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To prepare a layout drawing, which does not cause a defect easily, through simple processing. <P>SOLUTION: In a cell library that is used for layout design of a semiconductor integrated circuit and is a library of design data of cells each achieving a unit function; each of the design data comprises an attribute value indicating whether the cell easily causes a defect in a cell adjacently placed across the edge and whether a defect is easily caused by a cell adjacently placed across the edge, and attribute information that is associated with the attribute value. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
