发明名称 Voltage Margin Monitoring for an ADC-Based Serializer/Deserializer in Mission Mode
摘要 Various embodiments herein include one or more of systems, methods, software, and/or data structures to determine voltage margin for a high-speed serial data link. Advantageously, the margin determination may be made during normal operation of the data link (“mission mode”) such that the performance of the data link is not affected by the voltage margin measurements. That is, the margin measurements may be performed “on line” rather than “off line.” To facilitate the voltage margin measurement, a plurality of digital samples from an analog to digital converter (ADC) may be evaluated to determine the most probable bit values (i.e., digital 1's and 0's) that are represented by the digital samples. Then, a method may be used to remove or compensate for ISI effects from one or more of the digital samples, thereby providing an accurate representation of the voltage margin present in a data link. Subsequently, the voltage margin may be periodically monitored over time to detect degradation of the data link.
申请公布号 US2011150060(A1) 申请公布日期 2011.06.23
申请号 US20090645612 申请日期 2009.12.23
申请人 SUN MICROSYSTEMS, INC. 发明人 HUANG DAWEI;SONG DEQIANG;DOBLAR DREW G.;DEL ALAMO AGUSTIN
分类号 H04B17/00;H04L27/01 主分类号 H04B17/00
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