发明名称 |
ETCHANT AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING SAME |
摘要 |
Disclosed are: an etchant which is used for rewiring of a semiconductor substrate that has an electrode, and which is capable of selectively etching copper without etching nickel; and a method for manufacturing a semiconductor device using the etchant. Specifically disclosed are: an etchant which is used for rewiring of a semiconductor substrate and contains hydrogen peroxide and citric acid, and wherein the hydrogen peroxide content is 0.75-12% by mass, the citric acid content is 1-20% by mass and the molar ratio of hydrogen peroxide to citric acid is within the range of 0.3-5; an etchant for selective etching of copper, which is used for rewiring of a semiconductor substrate and contains hydrogen peroxide and malic acid, and wherein the hydrogen peroxide content is 0.75-12% by mass, the malic acid content is 1.5-25% by mass and the molar ratio of hydrogen peroxide to malic acid is within the range of 0.2-6; and a method for manufacturing a semiconductor device using the etchants. |
申请公布号 |
WO2011074589(A1) |
申请公布日期 |
2011.06.23 |
申请号 |
WO2010JP72506 |
申请日期 |
2010.12.14 |
申请人 |
MITSUBISHI GAS CHEMICAL COMPANY, INC.;HOSOMI, AKIRA;OHMAE, KENSUKE |
发明人 |
HOSOMI, AKIRA;OHMAE, KENSUKE |
分类号 |
H01L21/308;C23F1/18;H01L21/306;H01L21/3205;H01L21/3213;H01L23/52 |
主分类号 |
H01L21/308 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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