发明名称 Method for determining thickness of layer from tin coating to copper wire, during e.g. manufacturing of wire, involves finding quantity of non-precious metal in layer, and calculating thickness of free metal from surface of free metal
摘要 <p>The method involves detecting a potential range of a non-precious free metal i.e. tin, and an alloyed metal i.e. copper, in a measuring cycle. Quantity of the free metal is determined from a loading quantity and from resulting peak for the isolated free metal. The quantity of non-precious metal in an alloyed layer is determined from the loading quantity that is resulted by difference formation of two measuring curves in an area of the alloyed layer and integration of the curves. Layer thickness of the free metal is calculated from a surface of the metal in a measuring cell (1). An independent claim is also included for a device for implementing the method for determining thickness of layer in a precious metal and non-precious metal.</p>
申请公布号 DE102009060004(A1) 申请公布日期 2011.06.22
申请号 DE20091060004 申请日期 2009.12.21
申请人 ECH ELEKTROCHEMIE HALLE GMBH;MKM MANSFELDER KUPFER UND MESSING GMBH 发明人
分类号 G01B7/14;G01N17/04 主分类号 G01B7/14
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