发明名称 METHOD FOR MANUFACTURING REWRITEABLE THREE DIMENSIONAL MEMORY DEVICE
摘要 PURPOSE: A method for manufacturing a rewriteable three dimensional memory device is provided to reduce interface trap density by processing the rear side of the semiconductor film by surface treatment to form an oxidation passivation film. CONSTITUTION: In a method for manufacturing a rewriteable three dimensional memory device, a thin film structure is formed on a substrate(S10). A penetration area exposing a substrate to outside is formed by patterning the thin film structure(S20). A semiconductor film is uniformly formed on the inner side of a penetration region(S30). An oxidation passivation film is formed on the surface of the exposed semiconductor film to the penetration region by processing the semiconductor film through surface treatment(S40). An insulating layer filling the penetration region is formed after processing the semiconductor film by surface treatment.
申请公布号 KR20110068145(A) 申请公布日期 2011.06.22
申请号 KR20090124990 申请日期 2009.12.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SON, YONG HOON;HWANG, KI HYUN;BAIK, SEUNG JAE
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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