| 摘要 |
An improved and more accurate method for evaluating and correcting total measurement signals (TS(n)) of measuring devices. The invention concerns a method for evaluating and correcting total measurement signals (TS(n)) of a measuring device, wherein measuring signals are transmitted in the direction of a medium and reflected on a surface of the medium as wanted echo signals or on a surface of a disturbing element as interference signals and received. In the case of a modification of at least one technical, process condition in the container and/or a modification of at least one technical, measurement condition of the measuring device, an independent reference curve is ascertained on the basis of a current static reference curve, wherein the interference signals are masked out of the raw echo curve on the basis of a masking algorithm, which applies the independent reference curve.
|
