发明名称 Automatic sample alignment system and method of use
摘要 A system which automatically reduces change in effective angle and plane of incidence of a reflected focused beam of electromagnetic radiation entering a detector, via use of a detector with dimensions less than is the spatial spread of a reflected focused beam at a location distal to the location on said sample from which it is caused to reflect, preferably after passing through a collimating lens. The basis of operation is that the portion of a reflected focused beam intercepted by the detector changes with change in sample position and/or orientation.
申请公布号 US7965390(B1) 申请公布日期 2011.06.21
申请号 US20090378019 申请日期 2009.02.10
申请人 J.A. WOOLLAM CO., INC. 发明人 LIPHARDT MARTIN M.
分类号 G01B11/00;G01J4/00;G01N21/55 主分类号 G01B11/00
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