Defect-inspecting apparatus and contol method therof,申请号KR20080045086-传众专利搜索

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发明名称	Defect-inspecting apparatus and contol method therof
摘要
申请公布号	KR101041840(B1)	申请公布日期	2011.06.17
申请号	KR20080045086	申请日期	2008.05.15
申请人		发明人
分类号	G01N23/04;G01N23/00;G01N23/18	主分类号	G01N23/04
代理机构		代理人
主权项
地址

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