PURPOSE: A push apparatus for a test is provided to make a semiconductor device and a test socket closely contacted by tilting the semiconductor device according to a tilt angle of the test socket. CONSTITUTION: In a push apparatus for a test, a supporting plate(20) supports a guide member(30) and a pressing member(70). In the center of the guide member, a center hole(51) is extended up and down. The guide member is comprised of a supporting member(40) and a moving member(50). A second accommodating groove(52) having a shape corresponding to the accommodating groove of the supporting plate in the top of the moving member is installed. In the bottom of the supporting plate, a first accommodating groove(21) accepting the upper end of an elastic member(60) is installed.
