发明名称 Resist Composition and Patterning Process
摘要 <p>A resist composition comprises a polymer which increases its alkali solubility under the action of an acid as a base resin, and a copolymer comprising recurring units containing a sulfonic acid amine salt and recurring units containing at least one fluorine atom as an additive. The composition is suited for immersion lithography.</p>
申请公布号 KR101042462(B1) 申请公布日期 2011.06.16
申请号 KR20070106501 申请日期 2007.10.23
申请人 发明人
分类号 G03F7/004 主分类号 G03F7/004
代理机构 代理人
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