| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an image synthesizer which has a small effect of beam absorption on a device under test, and an image synthesis method. <P>SOLUTION: While actually-detected forward diffraction beam intensity and diffraction beam intensity contain effects of beam absorption in a tested body Sa, this method assumes that attenuation rates caused by beam absorption in these beams when passing through the tested body are the same. Based on the forward diffraction beam intensity and the diffraction beam intensity containing no effect of attenuation indicated by the attenuation rate, forward diffraction beam intensity and diffraction beam intensity, a refraction angleθ<SB>0</SB>of the beam when passing through the device under test Sa is calculated, then the refraction angleθ<SB>0</SB>is used to obtain a synthetic image of the tested body Sa. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
