发明名称 Electron detection device and scanning electron microscope
摘要 An electron detection device including: one scintillator 31 having an opening through which an electron beam emitted from an electron gun passes; a plurality of photoguides 22 of the same shape, which are bonded to the scintillator and disposed symmetrically about an optical axis; and a photomultiplier tube which is connected to one side of each of the photoguides 22, the side opposing to the optical axis side, and converts light into electrical signals, the light being emitted by the scintillator 31 receiving light through the photoguide 22. The photoguides 22 are joined so as to equally divide the scintillator 31 symmetrically about the optical axis. Moreover, a position and an area of a portion bonded to the scintillator 31, in each of the photoguides 22, are the same among the photoguides 22.
申请公布号 US2011139984(A1) 申请公布日期 2011.06.16
申请号 US20110931899 申请日期 2011.02.14
申请人 KURATA TSUGUO 发明人 KURATA TSUGUO
分类号 G01N23/225;G01T1/20 主分类号 G01N23/225
代理机构 代理人
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