发明名称 COMPOSITIONS COMPRISING BASE-REACTIVE COMPONENT AND PROCESSES FOR PHOTOLITHOGRAPHY
摘要 New photoresist compositions are provided that are useful for immersion lithography. Preferred photoresist compositions of the invention comprise one or more materials that have base-reactive groups. Particularly preferred photoresists of the invention can exhibit reduced leaching of resist materials into an immersion fluid contacting the resist layer during immersion lithography processing.
申请公布号 WO2011072307(A2) 申请公布日期 2011.06.16
申请号 WO2010US60152 申请日期 2010.12.13
申请人 ROHM AND HAAS ELECTRONIC MATERIALS, L.L.C.;WANG, DEYAN;LIU, JINRONG;LIU, CONG;KANG, DORIS;ZAMPINI, ANTHONRY;XU, CHENG-BAI 发明人 WANG, DEYAN;LIU, JINRONG;LIU, CONG;KANG, DORIS;ZAMPINI, ANTHONRY;XU, CHENG-BAI
分类号 G03F7/00;G03F7/004;H01L21/027 主分类号 G03F7/00
代理机构 代理人
主权项
地址