| 摘要 |
<p>Provided is a method for analyzing a bias of a crystal orientation distribution, by which a bias of a crystal orientation distribution of crystal particles in a composite member. The method for analyzing the bias of the crystal orientation distribution has an image creation step (ST1) of creating the image of the cross section of the crystal particles in the composite member, a determination step (ST2) of determining crystal orientations of the respective crystal particles in the image created in the image creation step (ST1), an assaying step (ST3) of specifying the distribution of the crystal orientation determined in the determination step (ST2), and an analysis step (ST4) of analyzing the bias of the crystal orientation distribution by analyzing the distribution obtained in the assaying step (ST3). The determination step (ST2) and the analysis step (ST4) can be carried out by using the electron backscatter diffraction pattern method.</p> |
