发明名称 APPEARANCE INSPECTION DEVICE
摘要 <p>Provided is an appearance inspection device capable of accurately inspecting the shape of even an object having a deeply colored pattern on the surface thereof. The appearance inspection device is provided with a surface pattern inspection means and a surface shape inspection means which are disposed near a transfer path for transferring an object to be inspected (K). The surface pattern inspection means is provided with a gray-scale image capturing unit (21, 51) for capturing a gray-scale image by applying diffusion light to the object to be inspected (K), and a pattern determination unit for determining the acceptance or nonacceptance of the surface pattern on the basis of the captured gray-scale image. The surface shape inspection means is provided with a slit light image capturing unit (31, 61) for capturing an image formed by applying band-shaped slit light to the object to be inspected (K), and a shape determination unit for determining the acceptance or nonacceptance of the surface shape on the basis of the captured image. The shape determination unit receives, from the pattern determination unit, information relating to a region in which at least a deep-color portion of the surface of the object to be inspected (K) is present, sets the received region to a non-inspection region, and determines the acceptance or nonacceptance of the shape.</p>
申请公布号 WO2011070914(A1) 申请公布日期 2011.06.16
申请号 WO2010JP70986 申请日期 2010.11.25
申请人 DAIICHI JITSUGYO VISWILL CO., LTD.;MATSUDA, SHINYA;AOKI, HIROSHI 发明人 MATSUDA, SHINYA;AOKI, HIROSHI
分类号 G01N21/85;G01B11/30 主分类号 G01N21/85
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