发明名称 SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To reduce contact resistance to a source electrode layer or a drain electrode layer electrically connected to an oxide semiconductor layer in a thin-film transistor using the oxide semiconductor layer. <P>SOLUTION: The source electrode layer or the drain electrode layer is formed in a layered structure of two layers or more, and one layer abutting on the oxide semiconductor layer from among the layer stack is formed of metal having a work function smaller than that of the oxide semiconductor layer, or an alloy of such metal. As a material of the second or subsequent source or the drain electrode layer, an element selected from Al, Cr, Cu, Ta, Ti, Mo, and W, an alloy with the elements as constituents, an alloy obtained by combining the elements or the like is used. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011119692(A) 申请公布日期 2011.06.16
申请号 JP20100242157 申请日期 2010.10.28
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;HIRAISHI SUZUNOSUKE;AKIMOTO KENGO;SAKATA JUNICHIRO
分类号 H01L29/786;H01L21/28 主分类号 H01L29/786
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