发明名称 APPARATUS AND METHOD FOR MEASURING THE PERFORMANCE OF EMBEDDED DEVICES
摘要 The apparatus for measuring the performance of embedded devices includes: a transceiver that transmits and receives data to and from the embedded devices; an interrupt generator that generates interrupt signal; a controller that controls the interrupt generator and the transceiver to generate the interrupt signal and transmits them to the embedded devices and performs a control to calculate real-time performance when the response signal to the interrupt signal are received from the embedded device through the transceiver; and a calculator that calculates the real-time performance of the embedded devices based on the interrupt signal generating time and the response signal receiving time.
申请公布号 US2011145457(A1) 申请公布日期 2011.06.16
申请号 US20100966945 申请日期 2010.12.13
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 JUNG YUNG-JOON;LIM DONG-HYOUK;LIM CHAE-DEOK;LIM DONG-SUN;HAM HO-SANG
分类号 G06F13/24 主分类号 G06F13/24
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