发明名称 CIRCUIT FOR TESTING INRUSH CURRENT
摘要 A circuit is configured for testing an inrush current of a power supply. The circuit includes a capacitor module, a voltage meter, a semiconductor switch, and a current meter. The capacitor module is connected to an power source for storing electric charge. The voltage meter is connected to the capacitor module for measuring a voltage across the capacitor module. The semiconductor switch is capable of connecting the capacitor module to the power supply and being closed when the voltage across the capacitor module reaches a predetermined value. The current meter is capable of measuring the inrush current at the time the power supply is powered on.
申请公布号 US2011140732(A1) 申请公布日期 2011.06.16
申请号 US20100753286 申请日期 2010.04.02
申请人 HONG FU JIN PRECISION INDUSTRY (SHENZHEN)CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 XIE LING-YU
分类号 G01R31/36;G01R31/40 主分类号 G01R31/36
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