发明名称 DEVELOP PROCESSING METHOD AND COMPUTER READABLE STORAGE MEDIUM
摘要 <p>PURPOSE: A developing treatment method for a substrate, and a computer memory device for performing thereof are provided to properly produce a resist pattern on a resist film for EUV on the substrate. CONSTITUTION: A developing treatment method for a substrate comprises a step of supplying a developer to the substrate for developing a resist film for EUV. The temperature of the developer is 5~23deg C. The developing treatment is performed for 10~30second. The concentration of the developer is less than 2.38mass%.</p>
申请公布号 KR20110066081(A) 申请公布日期 2011.06.16
申请号 KR20100107961 申请日期 2010.11.02
申请人 TOKYO ELECTRON LIMITED 发明人 TANAKA KEIICHI;YAMADA YOSHIAKI;KOSUGI HITOSHI
分类号 G03F7/26;H01L21/027 主分类号 G03F7/26
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