发明名称 |
METHOD OF REPRODUCING SEMICONDUCTOR SUBSTRATE, METHOD OF PREPARING REPRODUCED SEMICONDUCTOR SUBSTRATE, AND METHOD OF PREPARING SOI SUBSTRATE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a suitable method for reproduction of a semiconductor substrate. <P>SOLUTION: The method of reproducing a semiconductor substrate performs an etching process of removing an insulating layer from a semiconductor substrate having projections including a damaged semiconductor region and the insulating layer at the periphery of the semiconductor substrate, an etching process of selectively removing a damaged semiconductor region with respect to an undamaged semiconductor region using a liquid mixture containing a substance oxidizing a semiconductor material forming the semiconductor substrate, a substance dissolving the oxidized semiconductor material, and a substance controlling the speed of oxidizing the semiconductor material and the speed of dissolving the oxidized semiconductor material, and polishing the surface of the semiconductor substrate after the etching process of selectively removing the damaged semiconductor region. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
申请公布号 |
JP2011119666(A) |
申请公布日期 |
2011.06.16 |
申请号 |
JP20100236748 |
申请日期 |
2010.10.21 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
HANAOKA KAZUYA;YAMAZAKI SHUNPEI |
分类号 |
H01L21/02;H01L21/20;H01L21/265;H01L21/322;H01L21/336;H01L27/12;H01L29/786 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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