发明名称 Phase Change Memory with Various Grain Sizes
摘要 A memory device includes a phase change element, which further includes a first phase change layer having a first grain size; and a second phase change layer over the first phase change layer. The first and the second phase change layers are depth-wise regions of the phase change element. The second phase change layer has a second average grain size different from the first average grain size.
申请公布号 US2011140066(A1) 申请公布日期 2011.06.16
申请号 US201113029436 申请日期 2011.02.17
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIANG CHUN-SHENG;LEE TZYH-CHEANG;YANG FU-LIANG
分类号 H01L45/00 主分类号 H01L45/00
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