发明名称 DISPLACEMENT MEASUREMENT DEVICE, EXPOSURE APPARATUS, AND WORKING DEVICE
摘要 A device has a scale on which a grating pattern is formed, a light source to irradiate light on the scale, a wavelength plate to transform multiple diffracted lights from the light source into circular polarized light, respectively, an optical element to superposition and cause interference of the multiple diffracted lights, and a photodetector to receive the interfered light. Also, a generating unit to generate linearly polarized light by the light from the light source, so that the multiple diffracted lights input to the wavelength plate become linearly polarized light with a same mutual polarization direction.
申请公布号 US2011141451(A1) 申请公布日期 2011.06.16
申请号 US20100959301 申请日期 2010.12.02
申请人 CANON KABUSHIKI KAISHA 发明人 YAMAGUCHI WATARU;MATSUMOTO TAKAHIRO
分类号 G03B27/32;G01B9/02 主分类号 G03B27/32
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