发明名称 III-Nitride Monolithic IC
摘要 III-nitride materials are used to form isolation structures in high voltage ICs to isolate low voltage and high voltage functions on a monolithic power IC. Critical performance parameters are improved using III-nitride materials, due to the improved breakdown performance and thermal performance available in III-nitride semiconductor materials. An isolation structure may include a dielectric layer that is epitaxially grown using a III-nitride material to provide a simplified manufacturing process. The process permits the use of planar manufacturing technology to avoid additional manufacturing costs. High voltage power ICs have improved performance in a smaller package in comparison to corresponding silicon structures.
申请公布号 US2011143517(A1) 申请公布日期 2011.06.16
申请号 US201113027912 申请日期 2011.02.15
申请人 INTERNATIONAL RECTIFIER CORPORATION 发明人 BEACH ROBERT;BRIDGER PAUL
分类号 H01L21/761;H01L21/335;H01L21/76;H01L21/762;H01L27/095;H01L29/20 主分类号 H01L21/761
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