发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device using an oxide semiconductor having stable electric characteristics. <P>SOLUTION: An insulating layer including many defects typified by dangling bonds is formed over an oxide semiconductor layer with an oxygen-excess mixed region or an oxygen-excess oxide insulating layer interposed therebetween, whereby impurities in the oxide semiconductor layer such as hydrogen or moisture (hydrogen atom or compound including hydrogen atom such as H<SB>2</SB>O) are moved through the oxygen-excess mixed region or oxygen-excess oxide insulating layer and diffused into the insulating layer including defects, thus reducing the impurity concentration in the oxide semiconductor layer. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011119706(A) |
申请公布日期 |
2011.06.16 |
申请号 |
JP20100243369 |
申请日期 |
2010.10.29 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;MIYANAGA SHOJI;TAKAHASHI MASAHIRO;KISHIDA HIDEYUKI;SAKATA JUNICHIRO |
分类号 |
H01L29/786;G02F1/1368;G09F9/30;H01L21/20;H01L21/336;H01L51/50;H05B33/14 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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