发明名称 TEST FLOW PRESENTATION COMPUTER PROGRAM AND TEST FLOW PRESENTATION COMPUTER SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To achieve creation or the like of a test flow including a test necessary for accurately detecting a good product as a good product and a defective product as a defective product, and not including an unnecessary test. <P>SOLUTION: A processing means (1) calculates a test difficulty level by using one or more pieces of information on a net list, a package pin number, a test pin number, a desired operation frequency, process technology information, power consumption during the test, tester capacity in a test difficulty level calculation element database, based on a test difficulty level calculation expression, (2) identifies association between a DFT method associated with a test difficulty level criteria expression satisfied by the test difficulty level and priority from a test menu database and stores the association between the DFT method and the priority in a test flow database, and (3) sorts, with the association between the DFT method and the priority in the test flow database, the DFT method in the order of the associated priority, and makes an output means to display the sorted DFT method as a test flow for presentation. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011118492(A) 申请公布日期 2011.06.16
申请号 JP20090272996 申请日期 2009.12.01
申请人 SILICON TEST TECHNOLOGIES INC 发明人 IWASAKI KAZUHIKO;ARAI MASAYUKI;ICHINO KENICHI
分类号 G06F11/22;G01R31/28 主分类号 G06F11/22
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