发明名称 PHYSICAL QUANTITY MEASUREMENT DEVICE AND PHYSICAL QUANTITY MEASUREMENT METHOD
摘要 <p>It is possible to rapidly or highly accurately estimate a highly reliable offset according to situations and improve further the reliability of the estimated offset even if a measurement data is not obtained in a space in which the magnitude of a vector physical quantity to be measured is uniform. The offset included in the obtained vector physical quantity data are statistically estimated based on a predetermined evaluation formula using a difference vectors. In the estimation of the offset, reliability information on a reference point is calculated based on at least one of the vector physical quantity data, the difference vectors and a plurality of estimated reference points according to a calculation parameter for calculating the reliability information on the reference point, whether or not the reference point is reliable is determined by comparing the reliability information with a determination threshold value, and the reference point determined to be reliable is output as an offset included in vector physical quantity data determined by a data acquisition portion.</p>
申请公布号 KR20110066231(A) 申请公布日期 2011.06.16
申请号 KR20117011438 申请日期 2009.11.20
申请人 ASAHI KASEI MICRODEVICES CORPORATION 发明人 KITAMURA TOURU;MIKOSHIBA NORIHIKO
分类号 G01P15/00;G01C17/38;G01P13/00;G01P21/00 主分类号 G01P15/00
代理机构 代理人
主权项
地址