发明名称 |
PHYSICAL QUANTITY MEASUREMENT DEVICE AND PHYSICAL QUANTITY MEASUREMENT METHOD |
摘要 |
<p>It is possible to rapidly or highly accurately estimate a highly reliable offset according to situations and improve further the reliability of the estimated offset even if a measurement data is not obtained in a space in which the magnitude of a vector physical quantity to be measured is uniform. The offset included in the obtained vector physical quantity data are statistically estimated based on a predetermined evaluation formula using a difference vectors. In the estimation of the offset, reliability information on a reference point is calculated based on at least one of the vector physical quantity data, the difference vectors and a plurality of estimated reference points according to a calculation parameter for calculating the reliability information on the reference point, whether or not the reference point is reliable is determined by comparing the reliability information with a determination threshold value, and the reference point determined to be reliable is output as an offset included in vector physical quantity data determined by a data acquisition portion.</p> |
申请公布号 |
KR20110066231(A) |
申请公布日期 |
2011.06.16 |
申请号 |
KR20117011438 |
申请日期 |
2009.11.20 |
申请人 |
ASAHI KASEI MICRODEVICES CORPORATION |
发明人 |
KITAMURA TOURU;MIKOSHIBA NORIHIKO |
分类号 |
G01P15/00;G01C17/38;G01P13/00;G01P21/00 |
主分类号 |
G01P15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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