发明名称 FUNDUS IMAGING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To obtain a more distinct image in a fundus imaging apparatus having an aberration correcting mechanism. <P>SOLUTION: The fundus imaging apparatus includes: a fundus imaging optical system for imaging the fundus of an eye to be inspected based on reflected light from a fundus of the eye to be inspected, a wave surface sensor for detecting the wave surface aberration of the eye to be inspected, an aberration detecting optical system projecting measuring light to the fundus of the eye to be inspected and receiving the reflected light of the measuring light by the wave surface sensor, aberration correcting means arranged in the fundus imaging optical system for correcting the aberration of the eye to be inspected, and control means obtaining the fundus image based on the output signal from the fundus imaging optical system and controlling the aberration correcting means based on the detecting signal output from the wave surface sensor. The speed of the frame rate of the wave surface sensor is made higher than the frame rate when imaging the fundus image by the fundus image optical system in the control means. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011115301(A) 申请公布日期 2011.06.16
申请号 JP20090274059 申请日期 2009.12.02
申请人 NIDEK CO LTD 发明人 MUKAI HIDEO
分类号 A61B3/14 主分类号 A61B3/14
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