发明名称 OPTICAL PROFILOMETRY
摘要 A method for imaging an object using a microscope includes obtaining axial response data, the axial response data representative of a relationship between a separation between a top surface of the object and an objective lens of the microscope and an intensity of light reflected by the top surface of the object; positioning the object at a distance from the objective lens that is within a linear region of the axial response data; sequentially illuminating the object with a plurality of periodic patterns; obtaining a plurality of images of the object, each image resulting from the illumination of the object with a corresponding one of the plurality of periodic patterns; determining a reconstructed image of the object based on the plurality of images of the object; and, based on variations in the intensity of the reconstructed image, determining a topographic profile of the top surface of the object.
申请公布号 US2011141483(A1) 申请公布日期 2011.06.16
申请号 US20100966207 申请日期 2010.12.13
申请人 ACADEMIA SINICA 发明人 LEE CHAU-HWANG;WANG CHUN-CHIEH
分类号 G01B11/25 主分类号 G01B11/25
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