发明名称 PHOTODIODEN-SELBSTTEST
摘要 <p>A photodetector array (142) includes a plurality of photodetector cells (202) such as avalanche photodiodes (208) and readout circuits (210). An array self-tester (226) tests a dark count or other performance characteristic of the cells (202). The test is performed in connection with the manufacture of the array (142) or following the installation of the array (142) in a detection system (100).</p>
申请公布号 AT510222(T) 申请公布日期 2011.06.15
申请号 AT20080763125T 申请日期 2008.05.27
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 PRESCHER, GORDIAN;FRACH, THOMAS
分类号 G01R31/26 主分类号 G01R31/26
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