SEMICONDUCTOR DEVICE AND TEST METHOD OF IT

摘要

PURPOSE: A semiconductor device and a method for testing the same are provided to reduce cost required for implementing a testing process by reducing the number of output needles on probe cards. CONSTITUTION: An output controlling part(310) responds to an odd test controlling signal and an even test controlling signal from a test device and outputs a switching controlling signal. An output control switching part(330) responds to the switching controlling signal to transfer even numbered output of a semiconductor device to a half of output pins and transfer odd numbered output of the semiconductor device to remained output pins.