发明名称 |
X-ray detector for electron microscope |
摘要 |
<p>Multiple detectors (202) arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors (202) preferably include a shutter (108) and a cold shield (110) that reduce ice formation on the detector (202). By providing detectors (202) surrounding the sample (204), a large solid angle is provided for improved detection and x-rays are detected regardless of the direction of sample (204) tilt.
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申请公布号 |
EP2197019(A3) |
申请公布日期 |
2011.06.15 |
申请号 |
EP20090178789 |
申请日期 |
2009.12.11 |
申请人 |
FEI COMPANY |
发明人 |
VON HARRACH, HANNO;FREITAG, BERT;DONA, PLEUN |
分类号 |
H01J37/244;H01J37/26 |
主分类号 |
H01J37/244 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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