发明名称 Method and apparatus for phase correction in a scanned beam imager
摘要 A method for detecting scanner phase error in a bidirectional scanned beam imager includes obtaining first and second images derived from respective first and second scan directions, comparing apparent image feature positions in the first and second images, and calculating a phase error corresponding to a difference between the apparent image feature positions. The comparison may include multiplying frequency domain transformations of the images.
申请公布号 US7961362(B2) 申请公布日期 2011.06.14
申请号 US20070004474 申请日期 2007.12.19
申请人 MICROVISION, INC. 发明人 XU JIANHUA
分类号 H04N1/04 主分类号 H04N1/04
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