发明名称 Phase-change random access memory
摘要 A phase-change random access memory includes a memory block including a plurality of memory columns corresponding to the same column address and using different input/output paths; a redundancy memory block including a plurality of redundancy memory columns using different input/output paths; and an input/output controller repairing at least one of the plurality of memory columns using at least one of the plurality of redundancy memory columns, and controlling the number of memory columns simultaneously repaired using redundancy memory columns in response to an input/output repair mode control signal.
申请公布号 US7961508(B2) 申请公布日期 2011.06.14
申请号 US20100771028 申请日期 2010.04.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI BYUNG-GIL;KIM DU-EUNG;CHO WOO-YEONG;KIM HYE-JIN
分类号 G11C11/00 主分类号 G11C11/00
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