发明名称 Low leakage high performance static random access memory cell using dual-technology transistors
摘要 A memory cell includes a storage element, a write circuit coupled to the storage element and a read circuit coupled to the storage element. At least a portion of the storage element and at least a portion of the write circuit are fabricated using a thicker functional gate oxide and at least a portion of the read circuit is fabricated using a thinner functional gate oxide.
申请公布号 US7961499(B2) 申请公布日期 2011.06.14
申请号 US20090357938 申请日期 2009.01.22
申请人 QUALCOMM INCORPORATED 发明人 GARG MANISH;CHAI CHIAMING;PHAN MICHAEL THAITHANH
分类号 G11C11/00 主分类号 G11C11/00
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