APPARATUS AND METHOD FOR IN-SITU MEASUREMENT OF RESIDUAL SURFACE STRESSES

摘要

An apparatus for in situ measurement of residual stresses comprises a compact x-ray tube (104) and a detector. X-rays emitted by the x-ray tube (104) are diffracted from a specimen surface and intercepted by the detector. The intercepted x-rays are converted into light and transferred by a first fiber optic bundle (110) and a second fiber optic bundle (112) to light detection devices (118). Intensities of the received light are digitized by the light detection devices (118) to generate a first ring and a second ring with common centers. The residual stress in the specimen surface is calculated based on a difference between the radii of the first ring and the second ring.