| 发明名称 |
Generated set top calibration patterns in manufacturing |
| 摘要 |
Included are systems and methods for performing an internal operations test to a set top terminal (STT). At least one embodiment of a method includes creating a test pattern for testing video functionality of the STT, sending the created test pattern to a digital encoder, and converting the test pattern to an analog signal.
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| 申请公布号 |
US7961780(B2) |
申请公布日期 |
2011.06.14 |
| 申请号 |
US20060427747 |
申请日期 |
2006.06.29 |
| 申请人 |
MONTREUIL LEO;WILLIAMS WAYNE B;RUSS SAMUEL H;KRIETE ROBERT A |
发明人 |
MONTREUIL LEO;WILLIAMS WAYNE B.;RUSS SAMUEL H.;KRIETE ROBERT A. |
| 分类号 |
H04B17/00 |
主分类号 |
H04B17/00 |
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