发明名称 TESTING DEVICE, TESTING METHOD, CIRCUIT SYSTEM, POWER SUPPLY DEVICE, POWER SUPPLY EVALUATION DEVICE, AND METHOD FOR EMULATING POWER SUPPLY ENVIRONMENT
摘要 A main power supply supplies a power supply voltage to a power supply terminal of a DUT. A control pattern generator generates a control pattern including a pulse sequence. A compensation circuit intermittently injects a compensation current to the power supply terminal of the DUT via a path different from that of the main power supply. A switch is arranged between an output terminal of a voltage source and the power supply terminal of the DUT, and is turned on and off according to the control pattern.
申请公布号 KR20110063534(A) 申请公布日期 2011.06.10
申请号 KR20117008283 申请日期 2009.09.03
申请人 ADVANTEST CORPORATION 发明人 ISHIDA MASAHIRO;OKAYASU TOSHIYUKI;YAMAMOTO KAZUHIRO
分类号 G01R31/28 主分类号 G01R31/28
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