发明名称 THIN FILM TRANSISTOR WITH ASYMMETRIC STAGGERED ELECTRODE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>PURPOSE: A thin film transistor applying an asymmetric electrode structure and a manufacturing method thereof are provided to form a channel at a low resistance state by asymmetrically forming a source electrode and a drain electrode around a channel layer. CONSTITUTION: A gate insulation layer(12) is located on a gate electrode(11). A source electrode(14a), a channel layer(13), and a drain electrode(14b) are located on the gate insulation layer. The source electrode and the drain electrode are asymmetrically formed around the channel layer. The channel layer includes a first surface and a second surface. The source electrode and the drain electrode are contacted with both ends of the channel layer.</p>
申请公布号 KR101040137(B1) 申请公布日期 2011.06.10
申请号 KR20090121015 申请日期 2009.12.08
申请人 KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 LEE, SANG YEOL;CHONG, EU GENE;JO, KYOUNG CHUL
分类号 H01L29/786 主分类号 H01L29/786
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