发明名称 |
THIN FILM TRANSISTOR WITH ASYMMETRIC STAGGERED ELECTRODE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p>PURPOSE: A thin film transistor applying an asymmetric electrode structure and a manufacturing method thereof are provided to form a channel at a low resistance state by asymmetrically forming a source electrode and a drain electrode around a channel layer. CONSTITUTION: A gate insulation layer(12) is located on a gate electrode(11). A source electrode(14a), a channel layer(13), and a drain electrode(14b) are located on the gate insulation layer. The source electrode and the drain electrode are asymmetrically formed around the channel layer. The channel layer includes a first surface and a second surface. The source electrode and the drain electrode are contacted with both ends of the channel layer.</p> |
申请公布号 |
KR101040137(B1) |
申请公布日期 |
2011.06.10 |
申请号 |
KR20090121015 |
申请日期 |
2009.12.08 |
申请人 |
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
LEE, SANG YEOL;CHONG, EU GENE;JO, KYOUNG CHUL |
分类号 |
H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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