发明名称 Copper contamination detection method and system for monitoring copper contamination
摘要 A computer system. The computer system including a processor and memory unit coupled to the processor, the memory unit containing instructions that when executed by the processor implement a method for monitoring a solution in a tank used to fabricate integrated circuits, the method comprising the computer implemented steps of: (a) collecting data indicating of an amount of copper in a region of a substrate of a monitor, the monitor comprising an N-type region in a silicon substrate, the region abutting a top surface of the substrate, the monitor having been submerged in the solution for a preset time; (b) comparing the data to a specification for copper content of the solution; (c) if the data indicates a copper content exceeds a limit of the specification for copper, indicating a corrective action is required to prevent copper contamination of the integrated circuits; and (d) repeating steps (a) through (c) periodically.
申请公布号 US7957917(B2) 申请公布日期 2011.06.07
申请号 US20070863623 申请日期 2007.09.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BURNHAM JAY SANFORD;COMEAU JOSEPH KERRY VAUGHN;CRANE LESLIE PETER;ELLIOTT JAMES RANDALL;ESTES SCOTT ALAN;NAKOS JAMES SPIROS;WHITE ERIC JEFFREY
分类号 G01N30/04 主分类号 G01N30/04
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