发明名称 Memory having P-type split gate memory cells and method of operation
摘要 A memory comprising a plurality of P-channel split-gate memory cells are organized in rows and columns. Each of the plurality of P-channel split-gate memory cells comprises a select gate, a control gate, a source region, a drain region, a channel region, and a charge storage layer comprising nanocrystals. Programming a memory cell of the plurality of P-channel split-gate memory cells comprises injecting electrons from a channel region of the memory cell to the charge storage layer. Erasing the memory cell comprises injecting holes from the channel region to the charge storage region.
申请公布号 US7957190(B2) 申请公布日期 2011.06.07
申请号 US20080130197 申请日期 2008.05.30
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 HONG CHEONG M.;KANG SUNG-TAEG;WINSTEAD BRIAN A.
分类号 G11C16/04 主分类号 G11C16/04
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